Book (15 Jun 2006)
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Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed signal testing, test set compaction, design for test
| ISBN: | 9780769518251 |
| Publisher: | IEEE Computer Society |
| Imprint: | IEEE Computer Society |
| Pub date: | 15 Jun 2006 |
| DEWEY: | 621.381548 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 437 |
| Weight: | -1g |
| Height: | 266mm |
| Width: | 209mm |
| Spine width: | 25mm |
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