Paperback (15 Jun 2006)
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These 45 papers from the November 2002 symposium discuss techniques to assess and enhance the yield, reliability, and availability of VLSI systems. Several of the contributors present new approaches to fault simulation and injection, concurrent error detection, yield prediction, and sequential circuit design for testability. Specific topics include
| ISBN: | 9780769518312 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 15 Jun 2006 |
| Language: | English |
| Weight: | -1g |
| Height: | 215mm |
| Width: | 146mm |
| Spine width: | 25mm |
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