Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers - Advances in Imaging and Electron Physics

Hardback (03 Nov 2009)

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Publisher's Synopsis

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Book information

ISBN: 9780123747686
Publisher: Elsevier Science
Imprint: Academic Press
Pub date:
DEWEY: 539.720284
DEWEY edition: 22
Language: English
Number of pages: 381
Weight: 670g
Height: 229mm
Width: 152mm
Spine width: 32mm