Damage to VUV, EUV, and X-Ray Optics VI

Damage to VUV, EUV, and X-Ray Optics VI - Proceedings of SPIE

Paperback (30 Apr 2018)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9781510609730
Publisher: SPIE
Imprint: SPIE
Pub date:
Number of pages: 80
Weight: -1g
Height: 279mm
Width: 216mm