2nd, Revised and Enlarged Edition edition
Audio-visual / Multimedia Item (16 Feb 2007)
Not available for sale
Includes delivery to the United States
Out of stock
Provides a set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. This book describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics.
| ISBN: | 9783527610068 |
| Publisher: | Wiley VCH |
| Imprint: | Wiley-VCH |
| Pub date: | 16 Feb 2007 |
| Edition: | 2nd, Revised and Enlarged Edition edition |
| Language: | English |
| Number of pages: | 310 |
| Weight: | 732g |
| Height: | 209mm |
| Width: | 176mm |
| Spine width: | 21mm |
$10.01off
Hardback
Published 13 Jun 2023
Save $10.01
$8.54off
Hardback
Published 23 Nov 2023
Save $8.54
