Extreme Ultraviolet Lithography

Extreme Ultraviolet Lithography - SPIE Press Monographs

Paperback (30 Dec 2020)

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Publisher's Synopsis

This book covers the many aspects of lithographic technology that needed to be addressed in order to make EUV lithography ready for high-volume manufacturing: exposure tools, light sources, masks, resists, process control, metrology, and computational lithography. Lithography costs, which have often influenced the areas of technical focus, are discussed. Potential improvements to current EUV technology and extensions to future nodes are also covered. Each topic is approached from the perspective of a practicing lithographer in a wafer fab, in either manufacturing or development, and there are many references at the end of each chapter.

Book information

ISBN: 9781510639393
Publisher: SPIE Press
Imprint: SPIE
Pub date:
DEWEY: 621.381531
DEWEY edition: 23
Language: English
Number of pages: x, 233
Weight: 440g
Height: 176mm
Width: 252mm
Spine width: 16mm