In-Situ Electron Microscopy

In-Situ Electron Microscopy Applications in Physics, Chemistry and Materials Science

Hardback (26 Apr 2012)

Not available for sale

Includes delivery to the United States

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Publisher's Synopsis

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Book information

ISBN: 9783527319732
Publisher: Wiley
Imprint: Wiley-VCH
Pub date:
DEWEY: 502.825
DEWEY edition: 23
Language: English
Number of pages: 402
Weight: 910g
Height: 247mm
Width: 174mm
Spine width: 23mm