Publisher's Synopsis
Non-destructive testing (NDT) analysis techniques are used in science, technology and medicine to evaluate the properties of a material, component or system, without causing damage or altering the article being inspected. It is a highly valuable technique that can save money and time in product evaluation, troubleshooting, and research. Well known and widely used in industrial applications since the 60s, the NDT market is developing and growing fast. This book focuses on electromagnetic NDT methods and more specifically on the motion induced eddy current testing and evaluation (MIECTE) techniques used for conductive materials via electromagnetic methods, focusing on the Lorentz force eddy current testing (LET) method which was introduced recently. The authors present the modelling and simulation of LET systems as well as the optimal design of the measurement setups. They also show the wide variety of applications of the LET method including defect identification and sigmometry to estimate electrical conductivity of the tested material.
