Testing: Academic and Industrial Conference--Practice And Research Techniques

Testing: Academic and Industrial Conference--Practice And Research Techniques (TAIC PART 2007) : Co-Located With Mutation 2007 : Proceedings : 10Th-14Th September, 2007, Cumberland Lodge, Windsor, United Kingdom

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Book information

ISBN: 9780769529844
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 005.14
DEWEY edition: 22
Language: English
Number of pages: 243
Weight: -1g