Testing: Academic and Industry Conference--Practice and Research Techniques

Testing: Academic and Industry Conference--Practice and Research Techniques TAIC PART 2008 : 29-31, August 2008, Windsor, United Kingdom ; Sponsored by EPSRC ... [Et A.l]

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Book information

ISBN: 9780769533834
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 005.14
DEWEY edition: 22
Language: English
Number of pages: 106
Weight: -1g