VAST, IEEE Symposium on Visual Analytics Science and Technology, 2006

VAST, IEEE Symposium on Visual Analytics Science and Technology, 2006 Proceedings, Baltimore, Maryland, USA, October 31-November 2, 2006

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Book information

ISBN: 9781424405916
Publisher: IEEE
Imprint: IEEE
Pub date:
DEWEY: 006.6
DEWEY edition: 22
Language: English
Number of pages: 216
Weight: -1g