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| ISBN | 0306422875 | | Volumes | 1 | | ISBN13 | 9780306422874 (What's this?) | | Weight (grammes) | 2310 | | Publisher | Springer Science+Business Media | | Published in | New York | | Imprint | Kluwer Academic/Plenum Publishers | | Series ISSN | 29 | | Format | Hardback | | Series title | Advances in X-Ray Analysis | | Publication date | 01 Jun 1986 | | Height (mm) | 235 | | Library of Congress | 58035928 | | Width (mm) | 155 | | DEWEY | 543.085 | | Spine width (mm) | 36 | | DEWEY edition | DC21 | | Academic level | Undergraduate, Postgraduate, Professional / Scholarly | | Pages | 624 | |
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