ISBN: 9780878498475 - European Powder Diffraction (EPDIC 6) Earn 175 points
Free delivery on orders over £20 in the UK

European Powder Diffraction (EPDIC 6)

EPDIC 6 - Proceedings of the Sixth European Powder Diffraction

Proceedings of the Sixth European Conference on Powder Diffraction

R. Delhez, E.J. Mittemeijer

ISBN: 9780878498475
Format: Paperback
Publisher: Trans Tech Publications Ltd

The proceedings of the 6th European Conference on Powder Diffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). There are chapters on method development, development of instruments and techniques, software, synchrotron and neutron diffraction. More

£175.00
RRP £175.00

Availability: Usually despatched within 2 to 4 weeks
Free UK postage

Reserve in-store:
Not currently stocked in Blackwell stores. Ask your local store to obtain this item for you.

Wishlist:

The proceedings of the 6th European Conference on Powder Diffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). Chapters on method development, development of instruments and techniques, software, synchrotron and neutron diffraction offer new ideas on such subjects as microstructure of materials, determination of crysallographic structure, quantitative phase analysis and texture and coarse grains. Developments in analysis using the X-ray lens - a bundle of glass capillaries - and single or double X-ray mirrors continue. The some 130 contributions apply current powder diffraction methods to those materials of interest to scientists and engineers: metals and alloys, inorganics and minerals - including thin layers consisting of these materials - amorphous materials, polymers and organics. A large fraction of these papers analyze phase transformations and reactions in, or with, materials. Awareness is increasing that it is possible to use one set of well-chosen measurements to obtain quantitative information on various material characteristics that govern material properties. Furthermore, many papers show that the results benefit from additional analysis, e.g. TEM, DSC.